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Nikon Metrology presents latest innovations at the International Control Show

by on May 14, 2013

Nikon Metrology Blog


CONTROL 2013, the international trade fair for quality assurance will be the venue for releasing new inspection solutions within the extended Nikon Metrology product portfolio. With the introduction of the MCT225 HA, Nikon Metrology provides high accuracy Metrology CT for a wide range of sample sizes and material densities. In the field of CMM inspection, Nikon Metrology presents the ALTERA ceramic bridge CMM with multi-sensor CAMIO software. Another breakthrough is the NEXIV VMZ-R4540, a next-generation CNC Video Measuring System. Another reason to visit the Nikon Metrology booth is the premium range of microscopy solutions, including the brand new SMZ 25 & SMZ 18 and the BW-S50x surface profiler featuring picometer height resolution.


Absolute accuracy for Metrology-CT

The new MCT225 HA combines more than 95 years of Nikon experience in optical metrology, 50 years of LK experience in CMM metrology and 25 years of X-Tek experience in Computed Tomography (CT)…

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